Advances in X-ray free electron laser (XFEL) diffraction data processing applied to the crystal structure of the synaptotagmin-1 / SNARE complex
Category
Published on
Type
journal-article
Author
Artem Y Lyubimov and Monarin Uervirojnangkoorn and Oliver B Zeldin and Qiangjun Zhou and Minglei Zhao and Aaron S Brewster and Tara Michels-Clark and James M Holton and Nicholas K Sauter and William I Weis and Axel T Brunger
Citation
Lyubimov, A.Y. et al., 2016. Advances in X-ray free electron laser (XFEL) diffraction data processing applied to the crystal structure of the synaptotagmin-1 / SNARE complex. eLife, 5. Available at: http://dx.doi.org/10.7554/elife.18740.
Abstract
X-ray free electron lasers (XFELs) reduce the effects of radiation damage on macromolecular diffraction data and thereby extend the limiting resolution. Previously, we adapted classical post-refinement techniques to XFEL diffraction data to produce accurate diffraction data sets from a limited number of diffraction images (<xref ref-type="bibr" rid="bib35">Uervirojnangkoorn et al., 2015</xref>), and went on to use these techniques to obtain a complete data set from crystals of the synaptotagmin-1 / SNARE complex and to determine the structure at 3.5 Å resolution (<xref ref-type="bibr" rid="bib40">Zhou et al., 2015</xref>). Here, we describe new advances in our methods and present a reprocessed XFEL data set of the synaptotagmin-1 / SNARE complex. The reprocessing produced small improvements in electron density maps and the refined atomic model. The maps also contained more information than those of a lower resolution (4.1 Å) synchrotron data set. Processing a set of simulated XFEL diffraction images revealed that our methods yield accurate data and atomic models.
