Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers
Category
Published on
Type
journal-article
Author
Max O. Wiedorn and Salah Awel and Andrew J. Morgan and Miriam Barthelmess and Richard Bean and Kenneth R. Beyerlein and Leonard M. G. Chavas and Niko Eckerskorn and Holger Fleckenstein and Michael Heymann and Daniel A. Horke and Juraj Knoška and Valerio Mariani and Dominik Oberthür and Nils Roth and Oleksandr Yefanov and Anton Barty and Saša Bajt and Jochen Küpper and Andrei V. Rode and Richard A. Kirian and Henry N. Chapman
Citation
Wiedorn, M.O. et al., 2017. Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers. Journal of Synchrotron Radiation, 24(6), pp.1296–1298. Available at: http://dx.doi.org/10.1107/s1600577517011961.
Abstract
The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.
