Clustering and main sources of variance of SFX data
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Abstract
Wolfgang Brehm (University of Konstanz)
Clustering approaches and variance analysis are explained using the example of the indexing ambiguity in serial crystallography. Recently published algorithms for detwinning and advancements thereof will be shown. Variance analysis can lead to a more accurate result with less data by correcting the main dependent errors. Detecting anisotropy and enhancing the analysis of time dependant data are future perspectives.
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