Recent developments in CrystFEL
Category
Published on
Type
journal-article
Author
Thomas A. White and Valerio Mariani and Wolfgang Brehm and Oleksandr Yefanov and Anton Barty and Kenneth R. Beyerlein and Fedor Chervinskii and Lorenzo Galli and Cornelius Gati and Takanori Nakane and Alexandra Tolstikova and Keitaro Yamashita and Chun Hong Yoon and Kay Diederichs and Henry N. Chapman
Citation
White, T.A. et al., 2016. Recent developments in CrystFEL . J Appl Crystallogr, 49(2), pp.680–689. Available at: http://dx.doi.org/10.1107/s1600576716004751.
Abstract
CrystFELis a suite of programs for processing data from `serial crystallography' experiments, which are usually performed using X-ray free-electron lasers (FELs) but also increasingly with other X-ray sources. TheCrystFELsoftware suite has been under development since 2009, just before the first hard FEL experiments were performed, and has been significantly updated and improved since then. This article describes the most important improvements which have been made toCrystFELsince the first release version. These changes include the addition of new programs to the suite, the ability to resolve `indexing ambiguities' and several ways to improve the quality of the integrated data by more accurately modelling the underlying diffraction physics.