Orientation and analysis of XFEL serial diffraction patterns from fibrous molecular assemblies

By David H. Wojtas, Kartik Ayyer, Mengning Liang, Estelle Mossou, Carolin Seuring, V. Trevor Forsyth, Henry Chapman1, Rick P. Millane

1. Center for Free-Electron Laser Science

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Type

proceedings-article

Author

David H. Wojtas and Kartik Ayyer and Mengning Liang and Estelle Mossou and Carolin Seuring and V. Trevor Forsyth and Henry N. Chapman and Rick P. Millane

Citation

Wojtas, D.H. et al., 2017. Orientation and analysis of XFEL serial diffraction patterns from fibrous molecular assemblies. 2017 International Conference on Image and Vision Computing New Zealand (IVCNZ). Available at: http://dx.doi.org/10.1109/ivcnz.2017.8402508.

DOI