Practical considerations during processing of serial crystallographic XFEL data

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Abstract

Aaron Brewster (LBNL)

Fundamental differences exist between processing rotational data collected at a synchrotron source and data collected during a serial crystallographic XFEL experiment. Practical techniques will be described to enable the user to get the most out of their data using the cctbx.xfel package, from properly tuning parameters used during spot finding to common pitfalls encountered while indexing and merging. Specific attention will be paid to real use cases from users in the past, and how problems with their data were addressed.

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