Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers
17 Nov 2013 | Publications | Contributor(s): A. V. Martin, H. Hirsemann, D. Starodub, T. Ekeberg, I. Schlichting, R. G. Sierra, N. Coppola, L. Lomb, G. Weidenspointner, C. Wunderer, A. Barty, M. Liang, K. Nass, S. Marchesini, B. Rudek, H. J. Tobias, F. R. Maia, W. H. Benner, J. Schulz, R. L. Shoeman, N. Kimmel, M. Barthelmess, A. Rudenko, H. Graafsma, D. Rolles, L. Gumprecht, G. R. Farquar, C. Reich, A. Aquila, M. J. Bogan, J. Ullrich, S. Kassemeyer, P. Holl, B. Erk, H. J. Park, E. Pedersoli, V. Elser, J. Bozek, R. Hartmann, N. D. Loh, L. Strueder, H. Fleckenstein, C. Y. Hampton, A. Hartmann, L. Foucar, S. W. Epp, H. Soltau, G. Hauser, C. Bostedt, J. Steinbrener, S. Bajt, P. Bucksbaum, M. Hantke, Henry Chapman, Matthias Frank, Stefan Hau-Riege, Mark S. Hunter
Single shot diffraction imaging experiments via X-ray free-electron lasers can generate as many as hundreds of thousands of diffraction patterns of scattering objects. Recovering the real space …
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