Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers
17 Nov 2013 | Publications | Contributor(s): A. Rudenko, H. Graafsma, D. Rolles, J. Schulz, N. Kimmel, S. Marchesini, M. Barthelmess, G. R. Farquar, C. Reich, A. Aquila, W. H. Benner, R. L. Shoeman, L. Gumprecht, B. Erk, H. J. Park, E. Pedersoli, J. Ullrich, P. Holl, M. J. Bogan, A. Hartmann, H. Fleckenstein, C. Y. Hampton, N. D. Loh, S. Kassemeyer, L. Strueder, J. Bozek, G. Hauser, C. Bostedt, V. Elser, R. Hartmann, L. Foucar, H. Soltau, A. V. Martin, H. Hirsemann, D. Starodub, J. Steinbrener, P. Bucksbaum, S. W. Epp, M. Hantke, G. Weidenspointner, C. Wunderer, A. Barty, N. Coppola, S. Bajt, L. Lomb, I. Schlichting, F. R. Maia, B. Rudek, H. J. Tobias, R. G. Sierra, K. Nass, T. Ekeberg, M. Liang, Henry Chapman, Matthias Frank, Stefan Hau-Riege, Mark S. Hunter
Single shot diffraction imaging experiments via X-ray free-electron lasers can generate as many as hundreds of thousands of diffraction patterns of scattering objects. Recovering the real space …
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