Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers
17 Nov 2013 | Publications | Contributor(s): G. Weidenspointner, M. Hantke, S. Kassemeyer, C. Wunderer, J. Steinbrener, A. Barty, P. Bucksbaum, L. Lomb, R. Hartmann, B. Rudek, I. Schlichting, H. J. Tobias, N. Coppola, V. Elser, F. R. Maia, A. Rudenko, H. Graafsma, M. Liang, S. W. Epp, D. Rolles, K. Nass, G. R. Farquar, M. Barthelmess, S. Bajt, C. Reich, J. Schulz, A. Aquila, N. Kimmel, R. G. Sierra, B. Erk, H. J. Park, T. Ekeberg, E. Pedersoli, L. Gumprecht, P. Holl, H. Fleckenstein, M. J. Bogan, S. Marchesini, C. Y. Hampton, J. Ullrich, A. Hartmann, W. H. Benner, G. Hauser, L. Strueder, R. L. Shoeman, C. Bostedt, J. Bozek, N. D. Loh, A. V. Martin, H. Soltau, H. Hirsemann, D. Starodub, L. Foucar, Henry Chapman, Matthias Frank, Stefan Hau-Riege, Mark S. Hunter
Single shot diffraction imaging experiments via X-ray free-electron lasers can generate as many as hundreds of thousands of diffraction patterns of scattering objects. Recovering the real space …
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