Simultaneous femtosecond X-ray spectroscopy and diffraction of photosystem II at room temperature
25 Apr 2013 | Publications | Contributor(s): V. K. Yach, R. Tran, N. Echols, H. Laksmono, B. Lassalle-Kaiser, M. J. Bogan, R. Alonso-Mori, S. Koroidov, A. Miahnahri, J. Messinger, D. W. Schafer, P. D. Adams, J. Hattne, D. Difiore, M. M. Seibert, R. J. Gildea, U. Bergmann, A. Zouni, J. Yano, G. J. Williams, P. H. Zwart, S. Gul, A. Lampe, J. Kern, D. Sokaras, W. E. White, R. W. Grosse-Kunstleve, N. K. Sauter, J. E. Koglin, C. Glockner, M. J. Latimer, R. G. Sierra, T. C. Weng, A. R. Fry, J. Sellberg, G. Han, S. Boutet, P. Glatzel, J. Hellmich, D. Milathianaki, Mark Messerschmidt, Ranga Setlur
Intense femtosecond x-ray pulses produced at the Linac Coherent Light Source (LCLS) were used for simultaneous x-ray diffraction (XRD) and x-ray emission spectroscopy (XES) of microcrystals of …
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