Simultaneous femtosecond X-ray spectroscopy and diffraction of photosystem II at room temperature
25 Apr 2013 | Publications | Contributor(s): J. Messinger, S. Koroidov, D. W. Schafer, R. Alonso-Mori, A. Miahnahri, J. Hattne, D. Difiore, P. D. Adams, M. M. Seibert, A. Zouni, J. Yano, U. Bergmann, G. J. Williams, R. J. Gildea, J. Kern, S. Gul, D. Sokaras, P. H. Zwart, A. Lampe, R. W. Grosse-Kunstleve, C. Glockner, N. K. Sauter, M. J. Latimer, W. E. White, J. E. Koglin, A. R. Fry, J. Sellberg, T. C. Weng, G. Han, R. G. Sierra, J. Hellmich, S. Boutet, D. Milathianaki, P. Glatzel, R. Tran, B. Lassalle-Kaiser, N. Echols, M. J. Bogan, V. K. Yach, H. Laksmono, Mark Messerschmidt, Ranga Setlur
Intense femtosecond x-ray pulses produced at the Linac Coherent Light Source (LCLS) were used for simultaneous x-ray diffraction (XRD) and x-ray emission spectroscopy (XES) of microcrystals of …
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