Simultaneous femtosecond X-ray spectroscopy and diffraction of photosystem II at room temperature
25 Apr 2013 | Publications | Contributor(s): H. Laksmono, U. Bergmann, B. Lassalle-Kaiser, R. J. Gildea, M. J. Bogan, D. W. Schafer, S. Gul, A. Miahnahri, P. H. Zwart, J. Messinger, M. M. Seibert, N. K. Sauter, J. Hattne, W. E. White, D. Difiore, R. W. Grosse-Kunstleve, G. J. Williams, T. C. Weng, A. Zouni, R. G. Sierra, J. Yano, S. Boutet, A. Lampe, P. Glatzel, J. Kern, D. Sokaras, M. J. Latimer, N. Echols, J. E. Koglin, V. K. Yach, C. Glockner, R. Tran, G. Han, S. Koroidov, A. R. Fry, R. Alonso-Mori, J. Sellberg, P. D. Adams, J. Hellmich, D. Milathianaki, Mark Messerschmidt, Ranga Setlur
Intense femtosecond x-ray pulses produced at the Linac Coherent Light Source (LCLS) were used for simultaneous x-ray diffraction (XRD) and x-ray emission spectroscopy (XES) of microcrystals of …
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