Simultaneous femtosecond X-ray spectroscopy and diffraction of photosystem II at room temperature
25 Apr 2013 | Publications | Contributor(s): W. E. White, J. Hellmich, R. W. Grosse-Kunstleve, D. Milathianaki, N. K. Sauter, R. G. Sierra, B. Lassalle-Kaiser, M. J. Bogan, T. C. Weng, H. Laksmono, J. Messinger, S. Boutet, D. W. Schafer, P. Glatzel, A. Miahnahri, V. K. Yach, J. Hattne, R. Tran, D. Difiore, N. Echols, M. M. Seibert, R. Alonso-Mori, A. Zouni, J. Yano, S. Koroidov, G. J. Williams, J. Kern, D. Sokaras, P. D. Adams, A. Lampe, R. J. Gildea, C. Glockner, M. J. Latimer, U. Bergmann, J. E. Koglin, P. H. Zwart, A. R. Fry, J. Sellberg, S. Gul, G. Han, Mark Messerschmidt, Ranga Setlur
Intense femtosecond x-ray pulses produced at the Linac Coherent Light Source (LCLS) were used for simultaneous x-ray diffraction (XRD) and x-ray emission spectroscopy (XES) of microcrystals of …
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