Simultaneous femtosecond X-ray spectroscopy and diffraction of photosystem II at room temperature
25 Apr 2013 | Publications | Contributor(s): A. Zouni, N. K. Sauter, J. Yano, W. E. White, G. J. Williams, R. W. Grosse-Kunstleve, J. Kern, T. C. Weng, D. Sokaras, R. G. Sierra, A. Lampe, J. E. Koglin, S. Boutet, C. Glockner, P. Glatzel, M. J. Latimer, A. R. Fry, N. Echols, J. Sellberg, V. K. Yach, G. Han, R. Tran, J. Hellmich, S. Koroidov, D. Milathianaki, R. Alonso-Mori, B. Lassalle-Kaiser, P. D. Adams, M. J. Bogan, H. Laksmono, A. Miahnahri, J. Messinger, U. Bergmann, D. W. Schafer, R. J. Gildea, J. Hattne, S. Gul, D. Difiore, P. H. Zwart, M. M. Seibert, Mark Messerschmidt, Ranga Setlur
Intense femtosecond x-ray pulses produced at the Linac Coherent Light Source (LCLS) were used for simultaneous x-ray diffraction (XRD) and x-ray emission spectroscopy (XES) of microcrystals of …
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