Simultaneous femtosecond X-ray spectroscopy and diffraction of photosystem II at room temperature
25 Apr 2013 | Publications | Contributor(s): R. Alonso-Mori, J. Messinger, D. W. Schafer, S. Koroidov, A. Miahnahri, D. Difiore, M. M. Seibert, P. D. Adams, J. Hattne, A. Zouni, R. J. Gildea, J. Yano, G. J. Williams, U. Bergmann, P. H. Zwart, J. Kern, D. Sokaras, S. Gul, A. Lampe, W. E. White, C. Glockner, R. W. Grosse-Kunstleve, M. J. Latimer, N. K. Sauter, J. E. Koglin, R. G. Sierra, J. Sellberg, G. Han, T. C. Weng, A. R. Fry, J. Hellmich, D. Milathianaki, S. Boutet, P. Glatzel, V. K. Yach, B. Lassalle-Kaiser, R. Tran, M. J. Bogan, N. Echols, H. Laksmono, Mark Messerschmidt, Ranga Setlur
Intense femtosecond x-ray pulses produced at the Linac Coherent Light Source (LCLS) were used for simultaneous x-ray diffraction (XRD) and x-ray emission spectroscopy (XES) of microcrystals of …
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