Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers
17 Nov 2013 | Publications | Contributor(s): N. Coppola, G. Hauser, L. Lomb, C. Bostedt, I. Schlichting, S. Bajt, K. Nass, A. V. Martin, H. Hirsemann, M. Liang, D. Starodub, T. Ekeberg, R. G. Sierra, N. Kimmel, G. Weidenspointner, M. Barthelmess, C. Wunderer, J. Schulz, A. Barty, S. Marchesini, F. R. Maia, L. Gumprecht, B. Rudek, H. J. Tobias, W. H. Benner, R. L. Shoeman, J. Ullrich, A. Rudenko, P. Holl, H. Graafsma, M. J. Bogan, D. Rolles, N. D. Loh, G. R. Farquar, L. Strueder, C. Reich, J. Bozek, A. Aquila, S. Kassemeyer, L. Foucar, B. Erk, H. Soltau, H. J. Park, E. Pedersoli, V. Elser, R. Hartmann, J. Steinbrener, A. Hartmann, P. Bucksbaum, H. Fleckenstein, M. Hantke, C. Y. Hampton, S. W. Epp, Henry Chapman, Matthias Frank, Stefan Hau-Riege, Mark S. Hunter
Single shot diffraction imaging experiments via X-ray free-electron lasers can generate as many as hundreds of thousands of diffraction patterns of scattering objects. Recovering the real space …
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