Simultaneous femtosecond X-ray spectroscopy and diffraction of photosystem II at room temperature
25 Apr 2013 | Publications | Contributor(s): A. Zouni, J. Yano, P. D. Adams, G. J. Williams, J. Kern, D. Sokaras, U. Bergmann, A. Lampe, R. J. Gildea, C. Glockner, S. Gul, M. J. Latimer, P. H. Zwart, J. E. Koglin, J. Sellberg, N. K. Sauter, G. Han, W. E. White, A. R. Fry, R. W. Grosse-Kunstleve, J. Hellmich, D. Milathianaki, T. C. Weng, R. G. Sierra, B. Lassalle-Kaiser, S. Boutet, M. J. Bogan, P. Glatzel, H. Laksmono, J. Messinger, N. Echols, D. W. Schafer, V. K. Yach, A. Miahnahri, R. Tran, D. Difiore, S. Koroidov, M. M. Seibert, R. Alonso-Mori, J. Hattne, Mark Messerschmidt, Ranga Setlur
Intense femtosecond x-ray pulses produced at the Linac Coherent Light Source (LCLS) were used for simultaneous x-ray diffraction (XRD) and x-ray emission spectroscopy (XES) of microcrystals of …
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