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Silicon single crystal as back-reflector for high-intensity hard x-rays

By Tom Pardini, Sébastien Boutet, Joseph Bradley, Tilo Doeppner, Luke B. Fletcher, Dennis F. Gardner, Randy M. Hill, Mark S. Hunter1, Jacek Krzywinski, Marc Messerschmidt2, Arthur E. Pak, Florian Quirin, Klaus Sokolowski-Tinten, Garth J. Williams, Stefan Hau-Riege3

1. SLAC National Accelerator Laboratory 2. Arizona State University 3. Lawrence Livermore National Laboratory

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Category

BioXFEL Publications

Published on

Type

proceedings-article

Author

Tom Pardini and Sébastien Boutet and Joseph Bradley and Tilo Doeppner and Luke B. Fletcher and Dennis F. Gardner and Randy M. Hill and Mark S. Hunter and Jacek Krzywinski and Marc Messerschmidt and Arthur E. Pak and Florian Quirin and Klaus Sokolowski-Tinten and Garth J. Williams and Stefan P. Hau-Riege

Citation

Pardini, T. et al., 2014. Silicon single crystal as back-reflector for high-intensity hard x-rays S. P. Hau-Riege, S. P. Moeller, & M. Yabashi, eds. X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II. Available at: http://dx.doi.org/10.1117/12.2061087.

DOI

http://dx.doi.org/10.1117/12.2061087