Silicon single crystal as back-reflector for high-intensity hard x-rays
Category
Published on
Type
proceedings-article
Author
Tom Pardini and Sébastien Boutet and Joseph Bradley and Tilo Doeppner and Luke B. Fletcher and Dennis F. Gardner and Randy M. Hill and Mark S. Hunter and Jacek Krzywinski and Marc Messerschmidt and Arthur E. Pak and Florian Quirin and Klaus Sokolowski-Tinten and Garth J. Williams and Stefan P. Hau-Riege
Citation
Pardini, T. et al., 2014. Silicon single crystal as back-reflector for high-intensity hard x-rays S. P. Hau-Riege, S. P. Moeller, & M. Yabashi, eds. X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II. Available at: http://dx.doi.org/10.1117/12.2061087.