Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder
Category
Published on
Type
journal-article
Author
Kenneth R. Beyerlein and Christian Jooss and Anton Barty and Richard Bean and Sébastien Boutet and Sarnjeet S. Dhesi and R. Bruce Doak and Michael Först and Lorenzo Galli and Richard A. Kirian and Joseph Kozak and Michael Lang and Roman Mankowsky and Marc Messerschmidt and John C. H. Spence and Dingjie Wang and Uwe Weierstall and Thomas A. White and Garth J. Williams and Oleksandr Yefanov and Nadia A. Zatsepin and Andrea Cavalleri and Henry N. Chapman
Citation
Beyerlein, K.R. et al., 2014. Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder. Powder Diffraction, 30(S1), pp.S25–S30. Available at: http://dx.doi.org/10.1017/s0885715614001171.
Abstract
We report on the analysis of virtual powder-diffraction patterns from serial femtosecond crystallography (SFX) data collected at an X-ray free-electron laser. Different approaches to binning and normalizing these patterns are discussed with respect to the microstructural characteristics which each highlights. Analysis of SFX data from a powder of Pr0.5Ca0.5MnO3in this way finds evidence of other trace phases in its microstructure which was not detectable in a standard powder-diffraction measurement. Furthermore, a comparison between two virtual powder pattern integration strategies is shown to yield different diffraction peak broadening, indicating sensitivity to different types of microstrain. This paper is a first step in developing new data analysis methods for microstructure characterization from serial crystallography data.
