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Rayleigh-scattering microscopy for tracking and sizing nanoparticles in focused aerosol beams

By Max F. Hantke, Johan Bielecki, Olena Kulyk, Daniel Westphal, Daniel S. D. Larsson, Martin Svenda, Hemanth K. N. Reddy, Richard Kirian1, Jakob Andreasson, Janos Hajdu, Filipe R. N. C. Maia

1. Center for Free-Electron Laser Science

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