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Improving resolution in serial crystallography

By Kartik Ayyer, Oleksandr M. Yefanov, Dominik Oberthuer, Shatabdi Roy Chowdhury1, Lorenzo Galli, Valerio Mariani, Shibom Basu1, Jesse David Coe1, Chelsie E Conrad1, Raimund Fromme, Katerina Doerner, Matthias Frank2, Daniel James, Christopher Kupitz3, Markus Metz, Garrett Charles Nelson1, Xavier L. Paulraj, Kenneth Beyerlein, Marius Schmidt4, Iosifina Sarrou, John Spence1, Uwe Weierstall1, Thomas A. White, Jayhow Yang, Nadia Zatsepin1, Yun Zhao1, Mengning Liang, Andrew Aquila, Mark S. Hunter3, Joseph S. Robinson, Jason E. Koglin, Sébastien Boutet, Petra Fromme1, Anton Barty, Henry Chapman5

1. Arizona State University 2. Lawrence Livermore National Laboratory 3. SLAC National Accelerator Laboratory 4. University of Wisconsin - Milwaukee 5. Center for Free-Electron Laser Science

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Category

BioXFEL Publications

Published on

Type

journal-article

Author

Kartik Ayyer and Oleksandr M. Yefanov and Dominik Oberthuer and Shatabdi Chowdhury and Lorenzo Galli and Valerio Mariani and Shibom Basu and Jesse Coe and Chelsie E. Conrad and Raimund Fromme and Katerina Doerner and Matthias Frank and Daniel James and Christopher Kupitz and Markus Metz and Garrett Nelson and Xavier L. Paulraj and Kenneth Beyerlein and Marius Schmidt and Iosifina Sarrou and John C. H. Spence and Uwe Weierstall and Thomas A. White and Jayhow Yang and Nadia A. Zatsepin and Yun Zhao and Mengning Liang and Andrew Aquila and Mark S. Hunter and Joseph S. Robinson and Jason E. Koglin and Sébastien Boutet and Petra Fromme and Anton Barty and Henry N. Chapman

Citation

Ayyer, K. et al., 2015. Improving resolution in serial crystallography. Acta Cryst Sect A Found Adv, 71(a1), pp.s16–s16. Available at: http://dx.doi.org/10.1107/s2053273315099738.

DOI

http://dx.doi.org/10.1107/s2053273315099738