Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers
17 Nov 2013 | Publications | Contributor(s): M. Liang, K. Nass, G. Hauser, W. H. Benner, C. Bostedt, R. L. Shoeman, M. Barthelmess, J. Schulz, N. Kimmel, A. V. Martin, H. Hirsemann, D. Starodub, L. Gumprecht, G. Weidenspointner, C. Wunderer, S. Kassemeyer, A. Barty, P. Holl, M. J. Bogan, J. Ullrich, V. Elser, B. Rudek, R. Hartmann, H. J. Tobias, F. R. Maia, L. Strueder, J. Bozek, N. D. Loh, S. W. Epp, A. Rudenko, H. Graafsma, D. Rolles, H. Soltau, L. Foucar, G. R. Farquar, C. Reich, S. Bajt, A. Aquila, P. Bucksbaum, M. Hantke, J. Steinbrener, T. Ekeberg, B. Erk, R. G. Sierra, H. J. Park, E. Pedersoli, L. Lomb, I. Schlichting, N. Coppola, H. Fleckenstein, C. Y. Hampton, S. Marchesini, A. Hartmann, Henry Chapman, Matthias Frank, Stefan Hau-Riege, Mark S. Hunter
Single shot diffraction imaging experiments via X-ray free-electron lasers can generate as many as hundreds of thousands of diffraction patterns of scattering objects. Recovering the real space …
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