Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers
17 Nov 2013 | Publications | Contributor(s): A. Barty, T. Ekeberg, G. Weidenspointner, R. G. Sierra, C. Wunderer, M. Liang, K. Nass, S. Marchesini, F. R. Maia, B. Rudek, H. J. Tobias, N. Kimmel, M. Barthelmess, J. Schulz, A. Rudenko, W. H. Benner, H. Graafsma, R. L. Shoeman, D. Rolles, L. Gumprecht, A. Aquila, G. R. Farquar, C. Reich, P. Holl, M. J. Bogan, J. Ullrich, E. Pedersoli, B. Erk, H. J. Park, S. Kassemeyer, L. Strueder, J. Bozek, N. D. Loh, A. Hartmann, V. Elser, H. Fleckenstein, R. Hartmann, C. Y. Hampton, L. Foucar, H. Soltau, S. W. Epp, G. Hauser, C. Bostedt, P. Bucksbaum, M. Hantke, J. Steinbrener, D. Starodub, A. V. Martin, H. Hirsemann, S. Bajt, L. Lomb, I. Schlichting, N. Coppola, Henry Chapman, Matthias Frank, Stefan Hau-Riege, Mark S. Hunter
Single shot diffraction imaging experiments via X-ray free-electron lasers can generate as many as hundreds of thousands of diffraction patterns of scattering objects. Recovering the real space …
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